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Particle Analysis / Laser Particle Size Analysis

Bettersizer S3 Plus

Laser Diffraction
Dynamic Image Analysis
Patented DLOI Optics
ISO 13320
0.01–3,500 µm

Combines laser diffraction and dual CCD dynamic image analysis in a single platform. Measures particle size and shape parameters simultaneously across 0.01–3,500 µm. Automatic refractive index detection improves measurement accuracy for unknown samples.

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Bettersizer S3 Plus
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0.01–3,500 µm
Laser diffraction measurement range
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2–3,500 µm
Dynamic image analysis range
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96 detectors
Scattering angle: 0.02°–165°
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10 seconds
Average analysis time
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10,000 images
Particle capture in 60 seconds
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532 nm
Solid-state laser, no warm-up required
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ISO 13320
Laser diffraction standard
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21 CFR Pt.11
Pharmaceutical GMP / USP compliant
Bettersizer S3 Plus — Patented DLOI Optical System

Laser Diffraction System

Patented DLOI Design: 96 Detectors, 0.02°–165°

The DLOI (Dual Lenses and Oblique Incidence) optical design delivers high-resolution sub-micron measurements down to 0.01 µm. A single 532 nm solid-state laser provides a stable light source — no warm-up or stabilization time needed.

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96 Spherical Photodetectors
Captures scattered light signals simultaneously across a wide angular range of 0.02° to 165°.
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Fourier Optical Configuration
Accurately resolves ultra-fine particles down to 0.01 µm. Both Mie and Fraunhofer optical models are supported.
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Automatic Refractive Index Detection
Determines the refractive index of unknown samples automatically, maximising measurement reliability without prior sample characterization.
Bettersizer S3 Plus — Dual CCD Dynamic Image Analysis

Dynamic Image Analysis

Dual CCD Camera Dynamic Imaging

Operating independently from the laser diffraction channel, the dual-camera system delivers real-time particle shape and morphology data. Particularly suited to heterogeneous samples with unknown optical properties.

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0.5× and 10× Magnification
Two high-speed CCD cameras provide broad capture capability from 2 µm to 3,500 µm.
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10,000 Images in 60 Seconds
High-speed flash illumination enables large statistical sampling in a short measurement cycle.
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Agglomerate and Cluster Detection
Identifies agglomerates, crushed particles, and foreign matter based on specific geometric shape descriptors.

Frequently Asked Questions

What You Wonder About

The laser diffraction channel covers 0.01–3,500 µm; the dynamic image analysis channel covers 2–3,500 µm. Both systems operate simultaneously, providing complete coverage from colloidal to coarse particles in a single measurement.

DLOI stands for Dual Lenses and Oblique Incidence — a patented optical design by Bettersize. Compared to conventional Fourier optics, it offers a wider angular detection range (0.02°–165°) with 96 detectors, providing higher sub-micron resolution. A single 532 nm solid-state laser is used; no warm-up is required.

Yes. The S3 Plus automatically determines the refractive index of unknown samples during measurement. This is particularly useful for new material development and formulation screening. The dynamic imaging channel provides additional verification for heterogeneous samples.

Yes. During a single measurement, dispersed particles pass through two separate sample cells. The first cell performs laser diffraction for size distribution; the second cell captures CCD images for shape characterisation — at the same time. Results are combined in a single report, significantly accelerating method development and troubleshooting.

The Bettersizer S3 Plus complies with ISO 13320 (laser diffraction particle size analysis), USP, and 21 CFR Part 11 (electronic records and signatures). It is CE marked. This compliance scope enables direct use in pharmaceutical GMP environments and laboratories subject to international quality audits.

The S3 Plus features a lower detection limit of 0.01 µm, the patented DLOI optical system with 96 detectors, and built-in automatic refractive index detection. The dual-camera imaging system is integrated as a core component — not an optional add-on. It is designed for research-intensive applications and measurements that demand the highest optical resolution.

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