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Particle Analysis / Nanoparticle & Zeta Potential

BeNano 180 Zeta Max

DLS + ELS + SLS
Zeta Potential
0.3 nm – 50 µm
−15°C – 120°C
PALS Technology

BeNano 180 Zeta Max combines Dynamic Light Scattering (DLS), Electrophoretic Light Scattering (ELS/PALS), and Static Light Scattering (SLS) on a single platform. With patented RI measurement, concentration analysis, and sedimentation, it delivers comprehensive nanoparticle characterization through 10+ techniques.

Request a Quote → Technical Specifications
BeNano 180 Zeta Max
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0.3 nm–15 µm
DLS particle size measurement range
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50 µm
Maximum size via sedimentation
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3 µL
Minimum sample volume (DLS)
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−15°C – 120°C
Integrated temperature control range
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PALS
Phase Analysis Light Scattering — zeta potential
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10+ techniques
Single-platform measurement capacity
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7 models
Configuration options
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342 Da – 2×10⁷ Da
SLS molecular weight range
BeNano 180 Zeta Max — DLS and Zeta Potential System

DLS + ELS Optical System

173° Backscatter DLS and PALS Zeta Potential

A 50 mW 671 nm solid-state laser and APD detector deliver fast, repeatable size analysis from 0.3 nm to 15 µm. PALS provides accurate zeta potential measurement even in low-charge samples near the isoelectric point and in high-salt media.

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High-Sensitivity Optics
APD detector with >70% quantum efficiency. Single-mode fiber optics for high signal-to-noise ratio. Automatic intensity adjustment prevents multiple scattering.
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PALS Technology
20 Hz alternating electric field enables accurate zeta potential measurement where standard ELS fails — low-charge samples and high ionic-strength media.
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Wide Temperature Control
Integrated temperature control from −15°C to 120°C. Air purge system prevents condensation at sub-zero temperatures.
BeNano 180 Zeta Max — Sample Cells and Measurement Modes

Patented Techniques

RI, Concentration and Sedimentation

BeNano 180 Zeta Max goes beyond standard DLS/ELS with three patented measurement techniques. Refractive index (RI), particle concentration (LEDLS), and sedimentation sizing provide more complete characterization of complex samples.

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Refractive Index (RI) Measurement
Patented wedge-shaped cuvette technique measures RI from 1.2 to 1.6 with better than 0.1% accuracy. Eliminates up to 2% size error caused by RI uncertainty in DLS.
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LEDLS Concentration Analysis
Calibration-free nanoparticle concentration measurement from 1×10⁸ to 1×10¹² particles/mL. Ideal for compliance monitoring per EU nanomaterial definition (2011/696/EU).
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Sedimentation Sizing
Measures microparticles from 1 to 50 µm where DLS reaches its limits. Works complementarily with DLS to eliminate masking in broadly distributed samples.

Frequently Asked Questions

What You Wonder About

DLS covers 0.3 nm to 15 µm; sedimentation covers 1 µm to 50 µm. On the BeNano 180 Zeta Max, both techniques work together to eliminate masking in broadly distributed samples.

Zeta potential measurement requires a minimum of 64 µL. DLS requires as little as 3 µL. The platinum-folded capillary cell extends electrode lifetime in high-salt media.

Yes. BeNano 180 Zeta Pro and Max models integrate with GPC/SEC and FFF systems via the BFC-1 Signal Collector accessory. The 27 µL low-volume flow cell prevents band broadening; measurement speed is 0.42 s/result.

A 1% error in dispersant refractive index leads to a 2% error in DLS-derived size. The patented RI module on BeNano 180 Zeta Max measures RI from 1.2 to 1.6 with better than 0.1% accuracy using a wedge-shaped cuvette — eliminating this error source entirely.

Pharmaceuticals, biotechnology, nanomaterials, polymers, food and beverage, water treatment, cosmetics, and materials science. BeNano instruments are referenced in studies published in Nature Communications, Science Advances, and Advanced Functional Materials.

BAT-1 performs fully automated titration from pH 1 to 13. Each cycle delivers isoelectric point, size, and zeta potential trend data — in as little as 30 minutes per cycle. Minimal exposure to corrosive liquids improves operator safety and reduces human error.

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