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Particle Analysis / Particle Shape Analysis

BeVision M1

Automated Scanning
Panoramic Mode
34+ Parameters
ISO 16232
ISO 4406

BeVision M1 is an automated scanning system designed for filter cleanliness, film defect inspection and surface contamination analysis. A 55 × 55 mm panoramic field, 12 MP CMOS camera and Köhler illumination provide complete coverage across 0.3–10,000 μm.

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BeVision M1 — Automated Scanning and Panoramic Image Analysis System
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0.3–10,000 μm
Measurement range
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12 MP
CMOS camera (up to 120 FPS)
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55×55 mm
Panoramic scanning area
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34+
Size and shape parameters
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3–10 min
Typical measurement time
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ISO 16232
Industrial cleanliness standard
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ISO 4406
Fluid contamination classification
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18.7 kg
Instrument weight
BeVision M1 — 12 MP High-Speed CMOS Camera System

Optical System

12 MP High-Speed CMOS Camera

BeVision M1's metallurgical microscope is equipped with a 12 megapixel global shutter CMOS camera capable of up to 120 FPS. The global shutter eliminates motion blur during high-speed scanning, preserving measurement accuracy at every position.

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Global Shutter
The entire pixel array exposes simultaneously. Sharp particle images are captured without motion artifacts, regardless of scanning speed.
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Köhler Illumination
Uniform background illumination across the entire field of view. Consistent contrast ensures reliable particle segmentation throughout the measurement.
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4×, 5× BD, 10× BD, 10×/20× Objectives
Four objective options cover the full range from 0.3 μm to 10,000 μm. A 40× digital magnification option provides high resolution for fine fractions.
BeVision M1 — Efficient and Reliable Automated Scanning Mode

Automated Scanning Mode

Efficient and Reliable Scanning

In automated scanning mode, the stage moves continuously while image acquisition runs in parallel. The system delivers real-time statistical results as each field is processed.

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Software-Controlled Stage Movement
The X-Y stage is managed entirely by software. Scan parameters — area, overlap, speed — are configurable by the user for each measurement protocol.
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Parallel Image Processing
Capture and analysis run concurrently. Total measurement time is 3–10 minutes, depending on scan area and objective magnification.
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Positional Particle Map
Every particle's coordinates are recorded. Any particle can be revisited after analysis; spatial distribution across the filter surface can be visualized.
BeVision M1 — Workflow and Panoramic Analysis

Panoramic Mode

The Entire Area in One View

Panoramic mode stitches multiple images into a single composite view at millimeter scale, covering the full 55 × 55 mm slide surface. Every particle and defect is identified and mapped positionally.

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Automatic Image Stitching
Images captured during the scan are automatically aligned and merged. The resulting panorama covers the complete 55 × 55 mm field in a single view.
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Conditional Filtering and Re-scan
Particles meeting specific size or shape criteria are selected from the panoramic map. Selected regions can be re-scanned at higher magnification for detailed inspection.
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ISO 16232 and ISO 4406 Reporting
Total particle count, size classes, and contamination code are calculated automatically. Standard-compliant reports are generated directly by the software.

Technical Data

BeVision M1 - Technical Specifications

ParameterValue
Measurement Principle Static image analysis (SIA), automated scanning
Microscope Type Metallurgical microscope
Light Source Reflected light (halogen) + Transmitted light (Köhler illumination)
Objectives 4×, 5× BD, 10× BD, 10×/20× (40× digital magnification)
Camera CMOS, 12 MP, up to 120 FPS, global shutter
Measurement Range 0.3 – 10,000 μm
Panoramic Scanning Area 55 × 55 mm
Typical Measurement Time 3–10 minutes (depends on scan area and objective)
ISO Standards ISO 13321, ISO 9276, ISO 16232, ISO 4406
Dimensions (W × D × H) 35.0 × 65.0 × 67.0 cm
Weight 18.7 kg
Power Supply 100–240 VAC, 50/60 Hz
PC Requirements Windows 10/11 64-bit, Intel Core i5-8400 or higher, 16 GB RAM, 500 GB SSD
Optional Accessory BT-910 Dry Powder Disperser

Frequently Asked Questions

What You Wonder About

BeVision M1 measures from 0.3 μm to 10,000 μm. Sub-micron particles through coarse granules are covered by a single instrument. Resolution can be optimised by selecting the appropriate objective.

Scanning mode rapidly traverses a defined area on the slide and generates real-time statistics. Panoramic mode stitches multiple images to produce a complete map of the 55 × 55 mm area; every particle's position is recorded and selected regions can be re-examined at higher magnification.

A fluid sample collected during filtration is prepared on a membrane filter and mounted on a slide. BeVision M1 automatically counts particles in the 4 μm, 6 μm and 14 μm size channels after scanning and calculates the ISO 4406 contamination code.

M1 is purpose-built for filters and surfaces: panoramic scanning mode, a larger scan area (55 × 55 mm) and a 12 MP camera. S1 is a more compact, cost-effective system for powders and suspensions and is also available with a biological microscope. Both measure 34+ parameters and comply with ISO 9276.

The software calibration tool supports traceable calibration using reference materials certified to national metrology standards. No daily maintenance is required; optical surfaces are cleaned periodically. Anka Analitik provides installation, calibration and ongoing technical support.

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